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Reliable large-area germanium photodetectors fabricated with a diffused junction from in situ III-V epitaxial material

Author(s):
Morrison, C. B. ( Spectrolab, Inc. (USA) )
Boisvert, J. C. ( Spectrolab, Inc. (USA) )
Sudharsanan, R. ( Spectrolab, Inc. (USA) )
Haddad, M. ( Spectrolab, Inc. (USA) )
Isshiki, T. ( Spectrolab, Inc. (USA) )
Krut, D. D. ( Spectrolab, Inc. (USA) )
King, R. R. ( Spectrolab, Inc. (USA) )
Karam, N. H. ( Spectrolab, Inc. (USA) )
3 more
Publication title:
Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5209
Pub. Year:
2003
Page(from):
125
Page(to):
132
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450821 [0819450820]
Language:
English
Call no.:
P63600/5209
Type:
Conference Proceedings

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