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Effects of surface roughness on large-volume CdZnTe nuclear radiation detectors and removal of surface damage by chemical etching

Author(s):
Wright, G. W. ( Brookhaven National Lab. (USA) )
Camarda, G. ( Brookhaven National Lab. (USA) )
Kakuno, E. ( Brookhaven National Lab. (USA) )
Li, L. ( Yinnel Tech. Inc. (USA) )
Lu, F. ( Yinnel Tech. Inc. (USA) )
Lee, C. ( Yinnel Tech. Inc. (USA) )
Burger, A. ( Fisk Univ. (USA) )
Trombka, J. I. ( NASA Goddard Space Flight Ctr. (USA) )
Siddons, D. P. ( Brookhaven National Lab. (USA) )
James, R. B. ( Brookhaven National Lab. (USA) )
5 more
Publication title:
Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5198
Pub. date:
2004
Page(from):
306
Page(to):
313
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450715 [0819450715]
Language:
English
Call no.:
P63600/5198
Type:
Conference Proceedings

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