Effects of surface roughness on large-volume CdZnTe nuclear radiation detectors and removal of surface damage by chemical etching

Effects of surface roughness on large-volume CdZnTe nuclear radiation detectors and removal of surface damage by chemical etching

Author(s):

Wright, G. W. ( Brookhaven National Lab. (USA) )

Camarda, G. ( Brookhaven National Lab. (USA) )

Kakuno, E. ( Brookhaven National Lab. (USA) )

Li, L. ( Yinnel Tech. Inc. (USA) )

Lu, F. ( Yinnel Tech. Inc. (USA) )

Lee, C. ( Yinnel Tech. Inc. (USA) )

Burger, A. ( Fisk Univ. (USA) )

Trombka, J. I. ( NASA Goddard Space Flight Ctr. (USA) )

Siddons, D. P. ( Brookhaven National Lab. (USA) )

James, R. B. ( Brookhaven National Lab. (USA) )

5 more

Publication title:

Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5198

Pub. Year:

2004

Page(from):

306

Page(to):

313

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450715 [0819450715]

Language:

English

Call no.:

P63600/5198

Type:

Conference Proceedings

Details

TDL ID:	ZA00014635
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Hard X-Ray and Gamma-Ray Detector Physics
Conf. info. (Number):	2003 : 5th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.08.04-2003.08.05

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