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A safely inspection system for airfields based on x-ray technology

Author(s):
  • Jiao, J. ( Nanjing Univ. of Science and Technology (China) )
  • Zhang, J. ( Nanjing Univ. of Science and Technology (China) )
  • Chang, B. ( Nanjing Univ. of Science and Technology (China) )
  • Fu, R. ( Nanjing Univ. of Science and Technology (China) )
  • Gao, Q. ( Nanjing Univ. of Science and Technology (China) )
Publication title:
Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5198
Pub. Year:
2004
Page(from):
271
Page(to):
280
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450715 [0819450715]
Language:
English
Call no.:
P63600/5198
Type:
Conference Proceedings

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