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Advances in CCD technology for x-ray diffraction applications

Author(s):
Thorson, T. A. ( Bruker AXS Inc. (USA) )
Durst, R. D. ( Bruker AXS Inc. (USA) )
Frankel, D. ( Bruker AXS Inc. (USA) )
Bordwell, R. L. ( Fairchild Imaging (USA) )
Camara, J. R. ( Fairchild Imaging (USA) )
Leon-Guerrero, E. ( Fairchild Imaging (USA) )
Onishi, S. K. ( Fairchild Imaging (USA) )
Pang, F. ( Fairchild Imaging (USA) )
Vu, P. ( Fairchild Imaging (USA) )
Westbrook, E. M. ( Molecular Biology Consortium (USA) )
5 more
Publication title:
Hard X-ray and gamma-ray detector physics V : 4-5 August, 2003, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5198
Pub. Year:
2004
Page(from):
163
Page(to):
171
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819450715 [0819450715]
Language:
English
Call no.:
P63600/5198
Type:
Conference Proceedings

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