Focusing properties of silicon refractive lenses: comparison of experimental results with the computer simulation
- Author(s):
Snigireva, I. ( European Synchrotron Radiation Facility (France) ) Yunkin, V. ( Institute of Microelectronics Technology and High Purity Materials (Russia) ) Kuznetsov, S. ( Institute of Microelectronics Technology and High Purity Materials (Russia) ) Grigoriev, M. ( Institute of Microelectronics Technology and High Purity Materials (Russia) ) Chukalina, M. ( Institute of Microelectronics Technology and High Purity Materials (Russia) ) Shabel'nikov, L. ( Institute of Microelectronics Technology and High Purity Materials (Russia) ) Snigirev, A. ( European Synchrotron Radiation Facility (France) ) Hoffmann, M. ( Univ. Dortmund (Germany) ) Voges, E. ( Univ. Dortmund (Germany) ) - Publication title:
- Crystals, multilayers, and other synchrotron optics : 5 August 2003, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5195
- Pub. Year:
- 2003
- Page(from):
- 32
- Page(to):
- 39
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819450685 [0819450685]
- Language:
- English
- Call no.:
- P63600/5195
- Type:
- Conference Proceedings
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