Subpicosecond streak camera measurements at LLNL: from IR to x-rays

Subpicosecond streak camera measurements at LLNL: from IR to x-rays

Author(s):

Kuba, J. ( Lawrence Livermore National Lab. (USA) )

Shepherd, R. ( Lawrence Livermore National Lab. (USA) )

Booth, R. ( Lawrence Livermore National Lab. (USA) )

Stewart, R. E. ( Lawrence Livermore National Lab. (USA) )

Lee, E. C. W. ( Lawrence Livermore National Lab. (USA) )

Audebert, P. ( Lawrence Livermore National Lab. (USA) )

Crane, J. K. ( Lawrence Livermore National Lab. (USA) )

Cross, R. R. ( Lawrence Livermore National Lab. (USA) )

Dunn, J. ( Lawrence Livermore National Lab. (USA) )

Springer, P. T. ( Lawrence Livermore National Lab. (USA) )

5 more

Publication title:

Fourth-generation X-ray sources and ultrafast X-ray detectors :4 and 6 August 2003, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5194

Pub. Year:

2004

Page(from):

183

Page(to):

192

Pages:

10

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819450678 [0819450677]

Language:

English

Call no.:

P63600/5194

Type:

Conference Proceedings

Details

TDL ID:	ZA00014631
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Fourth-Generation X-Ray Sources and Ultrafast X-Ray Detectors
Conf. info. (Number):	2003
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2003.08.04, 2003.08.06

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