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Measurement of the magnetization in thin films using magneto-optical effects

Author(s):
  • Postava, K. ( Technical Univ. of Ostrava (Czech Republic) )
  • Pistora, J. ( Technical Univ. of Ostrava (Czech Republic) )
  • Ciprian, D. ( Technical Univ. of Ostrava (Czech Republic) )
  • Hlubina, P. ( Silesian Univ. at Opava (Czech Republic) )
Publication title:
Laser metrology and inspection : 14-15 June 1999, Munich, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3823
Pub. Year:
1999
Page(from):
281
Page(to):
288
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819433091 [0819433098]
Language:
English
Call no.:
P63600/3823
Type:
Conference Proceedings

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