Inspection and printability of programmed defects on reticles for 0.200- and 0.175-μm rule devices
- Author(s):
Yamaguchi, S. ( Toshiba Corp. (Japan) ) Kanai, H. ( Toshiba Corp. (Japan) ) Komano, H. ( Toshiba Corp. (Japan) ) Sakurai, H. ( Toshiba Corp. (Japan) ) Kondo, T. ( Toshiba Corp. (Japan) ) Itoh, M. ( Toshiba Corp. (Japan) ) Mori, I. ( Toshiba Corp. (Japan) ) Higashikawa, I. ( Toshiba Corp. (Japan) ) - Publication title:
- Photomask and X-Ray Mask Technology VI
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3748
- Pub. Year:
- 1999
- Page(from):
- 546
- Page(to):
- 556
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432308 [081943230X]
- Language:
- English
- Call no.:
- P63600/3748
- Type:
- Conference Proceedings
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