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A Low-Coherence Interferometer System for Simultaneous Measurement of Refractive Index and Thickness Ranging from 20μm to a Few Millimeters

Author(s):
Inoue, S. ( Osaka Univ. )
Maruyama, H. ( Kyushu Matsushita Electric, Japan. )
Mitsuyama, T. ( Osaka Univ. )
Ohmi, M. ( Osaka Univ. )
Ihara, K. ( Kyushu Matsushita Electric, Japan. )
Haruna, M. ( Osaka Univ. )
1 more
Publication title:
OFS-13 : 13th International Conference on Optical Fiber Sensors & Workshop on Device and System Technology toward Future Optical Fiber Communication and Sensing : April 12-16, 1999, Kyongju Hyundai Hotel, Kyongju, Korea
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3746
Pub. Year:
1999
Page(from):
124
Page(to):
127
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819432285 [0819432288]
Language:
English
Call no.:
P63600/3746
Type:
Conference Proceedings

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