X-ray imaging using lead iodide as a semiconductor detector

X-ray imaging using lead iodide as a semiconductor detector

Author(s):

Street, R.A. ( Xerox Palo Alto Research Ctr )

Rahn, J.T. ( Xerox Palo Alto Research Ctr )

Ready, S.E. ( Xerox Palo Alto Research Ctr )

Shah, K.S. ( Radiation Monitoring Devices, Inc )

Bennett, P.R. ( Radiation Monitoring Devices, Inc )

Dmitriyev, Y.N. ( Radiation Monitoring Devices, Inc )

Mei, P. ( Xerox Palo Alto Research Ctr )

Lu, J.-P. ( Xerox Palo Alto Research Ctr )

Apte, R.B. ( Xerox Palo Alto Research Ctr )

Ho, J. ( Xerox Palo Alto Research Ctr )

van Schuylenbergh, K. ( Xerox Palo Alto Research Ctr )

Lemmi, F. ( Xerox Palo Alto Research Ctr )

Boyce, J.B. ( Xerox Palo Alto Research Ctr )

Nylen, P. ( Univ. of Stockholm m (Sweden) )

9 more

Publication title:

Medical Imaging 1999: Physics of Medical Imaging

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3659

Pub. Year:

1999

Page(from):

36

Page(to):

47

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819431318 [0819431311]

Language:

English

Call no.:

P63600/3659-1

Type:

Conference Proceedings

Details

TDL ID:	ZA00014615
Series ID:	PA00000029
Conf. info. (Name):	Medical Imaging
Conf. info. (Number):	1999
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1999.02.21-1999.02.23

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