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Case against optical gauge block metrology (Invited Paper)

Author(s):
  • Doiroh, T.D. ( National Institute of Standards and Technology )
  • Everett, D. ( National Institute of Standards and Technology )
  • Faust, B.S. ( National Institute of Standards and Technology )
  • Stanfield, E.S. ( National Institute of Standards and Technology )
  • Stoup, J.R. ( National Institute of Standards and Technology )
Publication title:
Recent Developments in Optical Gauge Block Metrology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3477
Pub. date:
1998
Page(from):
188
Page(to):
198
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819429322 [0819429325]
Language:
English
Call no.:
P63600/3477
Type:
Conference Proceedings

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