Case against optical gauge block metrology (Invited Paper)
- Author(s):
- Doiroh, T.D. ( National Institute of Standards and Technology )
- Everett, D. ( National Institute of Standards and Technology )
- Faust, B.S. ( National Institute of Standards and Technology )
- Stanfield, E.S. ( National Institute of Standards and Technology )
- Stoup, J.R. ( National Institute of Standards and Technology )
- Publication title:
- Recent Developments in Optical Gauge Block Metrology
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3477
- Pub. Year:
- 1998
- Page(from):
- 188
- Page(to):
- 198
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819429322 [0819429325]
- Language:
- English
- Call no.:
- P63600/3477
- Type:
- Conference Proceedings
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