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Portable l2-stabilized Nd:YAG laser for wavelength standards at 532 nm and 1064 nm

Author(s):
Hong, F.-L. ( National Research Lab. of Metrology (Japan) )
Ishikawa, J. ( National Research Lab. of Metrology (Japan) )
Yoon, T.H. ( National Research Lab. of Metrology (Japan) )
Ma, L.-S. ( National Institute of Standards and Technology and Univ. of Colorado/Boulder )
Ye, J. ( National Institute of Standards and Technology and Univ. of Colorado/Boulder )
Hall, J.L. ( National Institute of Standards and Technology and Univ. of Colorado/Boulder )
1 more
Publication title:
Recent Developments in Optical Gauge Block Metrology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3477
Pub. Year:
1998
Page(from):
2
Page(to):
10
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819429322 [0819429325]
Language:
English
Call no.:
P63600/3477
Type:
Conference Proceedings

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