Kelvin Probe Microscopy and Cathodoluminescence Microanalysis of the Irradiation Induced Modification of Insulating Materials

Kelvin Probe Microscopy and Cathodoluminescence Microanalysis of the Irradiation Induced Modification of Insulating Materials

Author(s):: Stevens-Kalceff, Marion A.
Publication title:: Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.
Title of ser.:: Materials Research Society symposium proceedings
Ser. no.:: 738
Pub. Year:: 2003
Page(from):: 177
Page(to):: 364
Pages:: 194
Pub. info.:: Warrendale, Pa.: Materials Research Society
ISSN:: 02729172
ISBN:: 9781558996755 [1558996753]
Language:: English
Call no.:: M23500/738
Type:: Conference Proceedings

Details

TDL ID:	ZA00014609
Series ID:	PA00000011
Conf. info. (Name):	Symposium on spatially resolved characterization of local phenomena in materials and nanostructures
Conf. info. (Number):	2002
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2002.12.02-2002.12.05

Similar Items:

1 Conference Proceedings Investigation of Irradiation Damage in Silicon Dioxide Polymorphs Using Cathodoluminescence Microanalysis Stevens-Kalceff, Marion A. Materials Research Society	7 Conference Proceedings Heavy ion-induced damage and modifications of insulating materials Schwartz,K., Trautmann,C. SPIE-The International Society for Optical Engineering
2 Conference Proceedings Cathodoluminescence Microanalysis of Electron Irradiation Damage in Wide Bandgap Materials Kalceff, M. A. Stevens, Phillips, M. R., Toth, M., Moon, A. R., Jamieson, D. N., Orwa, J. O., Prawer, S. MRS - Materials Research Society	8 Conference Proceedings ATOM-PROBE MICROANALYSIS OF METALLIC NANOSTRUCTURED MATERIALS Mackenzie, Ross A.D., Cerezo, Alfred, Conyers, James S., Petford-Long, Amanda K., Sijbrandij, Sybren J., Smith, George … Materials Research Society
3 Conference Proceedings Investigation of Irradiation Damage in Silicon Dioxide Polymorphs Using CathodoluminescenceMicroanalysis Stevens-Kalceff, Marion A. Materials Research Society	9 Conference Proceedings Application of the scanning Kelvin microscopy for nondestructive material characterization Ivankov,A., Blum,R., Prasse,T., Sandler,J., Bauhofer,W. SPIE-The International Society for Optical Engineering
4 Conference Proceedings Comparative SEM and Cathodoluminescence Microanalysis of Porous GaP Structures Stevens-Kalceff, M. A., Langa, S., Tiginyanu, I. M., Carstensen, J., Christophersen, M., Foell, H. Materials Research Society	10 Conference Proceedings Scanning Kelvin Probe Force Microscopy-Chances and Limitations for in Situ Delamination Measurements Hornung, E., Rohwerder, M., Stratmann, M. Electrochemical Society
5 Conference Proceedings Micro-raman study of charge carrier distribution and cathodoluminescence microanalysis of porous GaP membranes Tiginyanu, I. M., Kalceff, M. A. Stevens, Sarua, A., Irmer, G., Monecke, J., Cojocari, O., Hartnagel, H. L. MRS-Materials Research Society	11 Conference Proceedings Mechanical Stress Characterization of Shallow Trench Isolation by Kelvin Probe Force Microscopy Rueda, H., Slinkman, J., Chidambarrao, D., Moszkowicz, L., Kaszuba, P., Law, M. MRS - Materials Research Society
6 Conference Proceedings Localized Charging Effects Resulting From Focused Ion Beam Processing of Non-Conductive Materials Stevens-Kalceff, Marion A., Rubanov, S., Munroe, P.R. Materials Research Society	12 Conference Proceedings Characterization of the CuGaSe2/ZnSe Interface Using Kelvin Probe Force Microscopy Sadewasser, S., Glatzel, Th., Rusu, M., Meeder, A., Marron, D. Fuertes, Jager-Waldau, A., Lux-Steiner, M.Ch. Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12