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Estimation of Silicon Nanocrystalline Sizes From Photoluminescence Measurements of RF Co-Sputtered Si/SiO2 Films

Author(s):
Publication title:
Quantum confined semiconductor nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
737
Pub. Year:
2003
Page(from):
437
Page(to):
884
Pages:
454
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996748 [1558996745]
Language:
English
Call no.:
M23500/737
Type:
Conference Proceedings

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