Photoelectron Spectroscopy Measurements of the Valence Band Structures of C60 Thin Films on Single Crystal Silicon and Polycrystalline Copper

Photoelectron Spectroscopy Measurements of the Valence Band Structures of C60 Thin Films on Single Crystal Silicon and Polycrystalline Copper

Author(s):

Publication title:

Polymer/metal interfaces and defect mediated phenomena in ordered polymers : symposia held December 2-6, 2002, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

734

Pub. Year:

2003

Page(from):

279

Page(to):

568

Pages:

296

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558996717 [1558996710]

Language:

English

Call no.:

M23500/734

Type:

Conference Proceedings

Details

TDL ID:	ZA00014605
Series ID:	PA00000011
Conf. info. (Name):	Symposium on polymer/metal interfaces and defect mediated phenomena in ordered polymers
Conf. info. (Number):	2002
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2002.12.02-2002.12.06

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