Optical And Structural Studies Of InGaN Layers And GaN/InGaN MQWs Using TPIS-MOCVD

Optical And Structural Studies Of InGaN Layers And GaN/InGaN MQWs Using TPIS-MOCVD

Author(s):

Kim, Sunwoon

Publication title:

Materials and devices for optoelectronics and microphotonics : symposium held April 1-5, 2002, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

722

Pub. Year:

2002

Page(from):

199

Page(to):

204

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558996588 [1558996583]

Language:

English

Call no.:

M23500/722

Type:

Conference Proceedings

Details

TDL ID:	ZA00014595
Series ID:	PA00000011
Conf. info. (Name):	Symposium on materials and devices for optoelectronics and microphotonics
Conf. info. (Number):	2002
Conf. info. (Venue):	San Francisco, CA, USA
Conf. info. (Date):	2002.04.01-2002.04.05

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