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Electrical Characterization Of Simox Soi Wafers With Mosos C-V Measurements

Author(s):
Li, C.L.
Yu, Y.H.
Chen, M.
Zou, S.C.
X, Sh.
Lin, Z.X.
1 more
Publication title:
Silicon materials - processing characterization and reliability : symposium held April 1-5, 2002, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
716
Pub. date:
2002
Page(from):
227
Page(to):
232
Pages:
6
Pub. info.:
Warrendale: Materials Research Society
ISSN:
02729172
ISBN:
9781558996526 [1558996524]
Language:
English
Call no.:
M23500/716
Type:
Conference Proceedings

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