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Lifetime Regime In The Electrically-Detected Transient Grating Method Applied To Amorphous and Microcrystalline Silicon Films

Author(s):
Sanguino, P.
Niehus, M.
Koynov, S.
Brogueira, P.
Schwarz, R.
Conde, J.P.
Chu, V.
Schiff, E.A.
3 more
Publication title:
Amorphous and heterogeneous silicon-based films - 2002 : symposium held April 2-5, 2002, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
715
Pub. Year:
2002
Page(from):
315
Page(to):
320
Pages:
6
Pub. info.:
Warrendale: Materials Research Society
ISSN:
02729172
ISBN:
9781558996519 [1558996516]
Language:
English
Call no.:
M23500/715
Type:
Conference Proceedings

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