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High Throughput X-ray Diffractometer for Combinatorial Epitaxial Thin Films

Author(s):
Ohtani, M.
Fukumura, T.
Ohtomo, A.
Kikuchi, T.
Omote, K.
Koinuma, H.
Kawasaki, M.
2 more
Publication title:
Combinatorial and artificial intelligence methods in materials science : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
700
Pub. date:
2002
Page(from):
125
Page(to):
132
Pages:
8
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996366 [1558996362]
Language:
English
Call no.:
M23500/700
Type:
Conference Proceedings

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