Scanning Electron-Beam Dielectric Microscopy for the Temperature Coefficient Distribution of Dielectric Materials

Scanning Electron-Beam Dielectric Microscopy for the Temperature Coefficient Distribution of Dielectric Materials

Author(s):: Cho, Yasuo
Publication title:: Combinatorial and artificial intelligence methods in materials science : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A
Title of ser.:: Materials Research Society symposium proceedings
Ser. no.:: 700
Pub. Year:: 2002
Page(from):: 103
Page(to):: 112
Pages:: 10
Pub. info.:: Warrendale, Pa.: Materials Research Society
ISSN:: 02729172
ISBN:: 9781558996366 [1558996362]
Language:: English
Call no.:: M23500/700
Type:: Conference Proceedings

Details

TDL ID:	ZA00014575
Series ID:	PA00000011
Conf. info. (Name):	Symposium on combinatorial and artificial intelligence methods in materials science
Conf. info. (Number):	2001
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2001.11.26-2001.11.29

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