Thickness-Fringe Contrast Analysis of Defects in GaN
- Author(s):
- Publication title:
- Dislocations and deformation mechanisms in thin films and small structures : symposium held April 17-19, 2001, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 673
- Pub. Year:
- 2001
- Pages:
- 6
- Pub. info.:
- Warrendale, PA: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558996090 [1558996095]
- Language:
- English
- Call no.:
- M23500/673
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
7
Conference Proceedings
THE DETERMINATION OF STEP HEIGHTS ON THE NON-UHV HEAT-TREATED MgO (100) SURFACE BY CBED
Materials Research Society |
Materials Research Society |
MRS - Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
10
Conference Proceedings
HIGH-RESOLUTION ELECTRON MICROSCOPY OF HEMATITE FORMED BY EXTERNAL OXIDATION OF IRON-BEARING OLIVINE
Materials Research Society |
Materials Research Society |
Materials Research Society |
6
Conference Proceedings
Defects in GaN Pyramids Grown on Si(111) Substrates by Selective Lateral Overgrowth
MRS - Materials Research Society |
12
Conference Proceedings
A TECHNIQUE FOR THE EXAMINATION OF SURFACE EFFECTS IN ALUMINUM NITRIDE CERAMICS
Materials Research Society |