Blank Cover Image

Effect of Arsenic on Extended Defect Evolution in Silicon

Author(s):
Publication title:
Si front-end processing -- physics and technology of dopant-defect interactions III : symposium held April 17-19, 2001, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
669
Pub. Year:
2001
Pages:
6
Pub. info.:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558996052 [1558996052]
Language:
English
Call no.:
M23500/669
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Modeling of Dopant Defect Interactions

Camarce, C., Radic, L., Keys, P., Brindos, R, Jones, K.S., Law, M.E.

Materials Research Society

Jones, K.S., Prussin, S.

Materials Research Society

Brindos, R., Law, M. E., Jones, K. S., Andideh, E.

MRS - Materials Research Society

Chaudhey, S., Law, M.E.

Electrochemical Society

Brindos, R., Clark, M.H., Jones, K.S., Griglione, M., Gossmann, Hans-J., Agarwal, A., Murto, B., Andideh, E.

Materials Research Society

JONES,K.S., PRUSSIN,S., WEBER,E.R.

Trans Tech Publications

Law, M.E., Jones, K.S.

Electrochemical Society

10 Conference Proceedings Modeling of Extended Defects in Silicon

Law, M. E., Jones, K. S., Earles, S. K., Lilak, A. D., Xu, J-W.

MRS - Materials Research Society

Brindos, R., Keys, P.H., Griglione, M., Jones, K. S., Law, M. E., Agarwal, Aditya, Andideh, Ebrahim

Materials Research Society

11 Conference Proceedings Modeling of Extended Defects in Silicon

Law, M. E., Jones, K. S., Earles, S. K., Lilak, A. D., Xu, J-W.

MRS - Materials Research Society

Crosby, Robert, Frazer, Jackie, Jones, K.S., Law, M.E., Larsen, A. Nylandsted, Hansen, J. Lundsgaard

Materials Research Society

Keys, P. H., Li, J. H., Heitman, E., Packan, P. A., Law, M. E., Jones, K. S.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12