Blank Cover Image

Growth and Characterization of Self Assembled Palladium Oxide Nanostructures

Author(s):
Publication title:
Transport and microstructural phenomena in oxide electronics : symposium held April 16-20, 2001, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
666
Pub. Year:
2001
Pages:
6
Pub. info.:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558996021 [1558996028]
Language:
English
Call no.:
M23500/666
Type:
Conference Proceedings

Similar Items:

Chalamala, Babu R., Reuss, Robert H., Trottier, Troy A., Penn, Cecil W., Wei, Yi

SPIE

Janik,J.A., Heflin,J.R., Marciu,D., Miller,M.B., Wang,H., Gibson,H.W., Davis,R.M.

SPIE-The International Society for Optical Engineering

2 Conference Proceedings Self-assembled nanostructured sensors

Lalli, J.H., Hill, A., Hannah, S., Subrahmanyan, S., Bortner, M., Mecham, J., Davis, B., Goff, R., Claus, R.O.

SPIE - The International Society of Optical Engineering

Lalli, J.H., Hill, A., Hannah, S., Bortner, M., Subrahmanyan, S., Mecham, J.B., Davis, B.A., Claus, R.O.

SPIE - The International Society of Optical Engineering

Johnson, S., Markwitz, A., Rudolphi, M., Baumann, H., Kuo, P.-Y., Blaikie, R.

SPIE - The International Society of Optical Engineering

Mulligan, Robert F, Iliadis, Agis A., Lee, U, Kofinas, Peter

Materials Research Society

Aggarwal, Sanjeev, Dieckmann, Rudiger

MRS - Materials Research Society

Maskus M., Tirado J., Hudson J., Bretz R., Abruna D. H.

Kluwer Academic Publishers

S. Choi, J. Jang, S. Yi, J. Kim, W. Jung

SPIE - The International Society of Optical Engineering

Lalli, J. H., Mecham, J. B., Davis, B., Arregui, F. J., Matias, I. R., Claus, R. O.

SPIE - The International Society of Optical Engineering

Eisele I., Baumgartner H., Hansch W.

Kluwer Academic Publishers

M.H. Mendoza, R.L. Antaño, Y.V. Meas

Electrochemical Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12