Blank Cover Image

Finite Element Analysis of the Precracked Line Scratch Test

Author(s):
Publication title:
Materials science of microelectromechanical systems (MEMS) devices III : symposium held November 27-28, 2000, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
657
Pub. Year:
2001
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995673 [1558995676]
Language:
English
Call no.:
M23500/657
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Microstructure and Mechanical Properties of Electroplated Cu Thin Films

Voinsky, A.A., Vella, J., Adhihetty, I.S., Sarihan, V., Mercado, L., Yeung, B.H., Gerberich, W.W.

Materials Research Society
7 Conference Proceedings Measurement of Polymer-Polymer Adhesion in Thin Multi-Layer Systems by Means of Micro-Scratch Probing

Garif, Y.S., Gerberich, W.W., Macosko, C.W., Pocius, A.V.

Materials Research Society
2 Conference Proceedings Macroscopic Modelling of Fine Line Adhesion Tests

Volinsky, A. A., Nelson, J. C., Gerberich, W. W.

MRS - Materials Research Society
8 Conference Proceedings ELECTRON CHANNELING ANALYSIS OF ELASTIC STRAINS IN InGaAs THIN FILMS

Keller, R., Zielinski, W., Gerberich, W.W., Kozubowski, J.A.

Materials Research Society
3 Conference Proceedings Acoustic Emission Analysis of Fracture Events in Cu Films with W Overlayers

Volinsky, A. A., Gerberich, W. W.

MRS - Materials Research Society
9 Conference Proceedings *A brittle to ductile transition (BDT) in adhered thin films

Gerberich, W. W., Volinsky, A. A., Tymiak, N. I., Moody, N. R.

MRS-Materials Research Society
4 Conference Proceedings THIN FILM ADHESION CHARACTERIZATION BY MICROWEDGE SCRATCHING OF PRECRACKED FINE LINES

Boer, M. P. de, Huang, H., Gerberich, W. W.

MRS - Materials Research Society
10 Conference Proceedings Environmental Effects on Cu/SiO2 and Cu/Ti/SiO2 Thin Film Adhesion

Tymiak, N. I., Li, M., Volinsky, A. A., Katz, Y., Gerberich, W. W.

MRS - Materials Research Society
5 Conference Proceedings RESIDUAL STRESS EFFECTS IN THE SCRATCH ADHESION TESTING OF TANTALUM THIN FILMS

White, Richard L., Nelson, John, Gerberich, William W.

MRS - Materials Research Society
11 Conference Proceedings Superlayer residual stress effect on the indentation adhesion measurements

Volinsky, Alex A., Moody, Neville R., Gerberich, William W.

MRS-Materials Research Society
6 Conference Proceedings ADHESION STRENGTH OF Cu/POLYIMIDE MEASURED BY CONTINUOUS MICRO-WEDGE SCRATCH TEST

Wang, F., Nelson, J. C., Huang, H., Boer, M. de, Gerberich, W. W., Swisher, R. L.

MRS - Materials Research Society
12 Conference Proceedings 'Incompressible' Pore Effect on the Mechanical Behavior of Low-k Dielectric Films

Volinsky, Alex A., Palacio, Manuel-Luis B., Gerberich, William W.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12