Structural Characterization of InAs/GaAs and InAs/InP Quantum Dots by Transmission Electron Microscopy
- Author(s):
McCaffrey, John P. Robertson, Michael D. Poole, Phillip Wasilewski, Zbig R. Riel, Bruno Williams, Robin Fafard, Simon - Publication title:
- Semiconductor quantum dots II : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 642
- Pub. Year:
- 2001
- Pages:
- 10
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558995529 [1558995528]
- Language:
- English
- Call no.:
- M23500/642
- Type:
- Conference Proceedings
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