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Physical Characterization of Residual Implant Damage in 4H-SiC Double Implanted Bipolar Technology

Author(s):
Wright, N.G.
Johnson, C.M.
O'Neill, A.G.
Horsfall, A.
Phelps, G.J.
Adachi, K.
Knights, A.P.
Ortolland, S.
Coleman, P.G.
Burrows, C.P.
5 more
Publication title:
Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
640
Pub. Year:
2001
Pages:
5
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558995505 [1558995501]
Language:
English
Call no.:
M23500/640
Type:
Conference Proceedings

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