Surface Structure and Polarization Effects in GaN Thin Films as Studied by Electric Force Microscopy

Surface Structure and Polarization Effects in GaN Thin Films as Studied by Electric Force Microscopy

Author(s):

Jones, K.M.

Publication title:

GaN and related alloys - 2000 : symposium held November 27-December 1, 2000, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

639

Pub. Year:

2001

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558995499 [1558995498]

Language:

English

Call no.:

M23500/639

Type:

Conference Proceedings

Details

TDL ID:	ZA00014526
Series ID:	PA00000011
Conf. info. (Name):	Symposium on gan and related alloys
Conf. info. (Number):	2000
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2000.11.27-2000.12.01

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