Effect of the Load Resistance in the Linearity and Sensitivity of MIS Position Sensitive Detectors

Effect of the Load Resistance in the Linearity and Sensitivity of MIS Position Sensitive Detectors

Author(s):

Publication title:

Amorphous and nanocrystalline silicon science and technology - 2005 : symposium held March 28-April 1, 2005, San Francisco, California, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

862

Pub. Year:

2005

Page(from):

691

Page(to):

696

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558998155 [1558998152]

Language:

English

Call no.:

M23500/862

Type:

Conference Proceedings

Details

TDL ID:	ZA00014506
Series ID:	PA00000011
Conf. info. (Name):	MRS Spring Meeting
Conf. info. (Number):	2005
Conf. info. (Venue):	San Francisco, California, U.S.A.
Conf. info. (Date):	2005.03.28-2005.04.01

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