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Junction Temperature Measurements in Deep-UV Light-Emitting Diodes

Author(s):
Xi, Y.
Xi, J. -Q.
Gessmann, Th.
Shah, J. M.
Kim, J. K.
Schubert, E. F.
Fischer, A. J.
Crawford, M. H.
Bogart, K. H. A.
Allerman, A. A.
5 more
Publication title:
GaN, AIN, InN and their alloys : symposium held November 29-December 3, 2004, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
831
Pub. Year:
2005
Page(from):
37
Page(to):
42
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997790 [1558997792]
Language:
English
Call no.:
M23500/831
Type:
Conference Proceedings

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