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Bias-Voltage Dependence in Atomic-Scale Spin Polarized Scanning Tunneling Microscopy of Mn3N2(010)

Author(s):
Publication title:
Advanced data storage materials and characterization techniques : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
803
Pub. Year:
2004
Page(from):
41
Page(to):
48
Pages:
8
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997417 [1558997415]
Language:
English
Call no.:
M23500/803
Type:
Conference Proceedings

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