Temperature Controlled Scanning Nonlinear Dielectric Microscopy

Temperature Controlled Scanning Nonlinear Dielectric Microscopy

Author(s):

Publication title:

Advanced data storage materials and characterization techniques : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

803

Pub. Year:

2004

Page(from):

27

Page(to):

34

Pages:

8

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558997417 [1558997415]

Language:

English

Call no.:

M23500/803

Type:

Conference Proceedings

Details

TDL ID:	ZA00014475
Series ID:	PA00000011
Conf. info. (Name):	Symposium on advanced data storage materials and characterization techniques
Conf. info. (Number):	2003
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2003.12.01-2003.12.04

Similar Items:

1 Conference Proceedings Higher Order Nonlinear Dielectric Microscopy Cho, Yasuo, Ohara, Koya Materials Research Society	7 Conference Proceedings Visualization of Electrons and Holes Localized in the Gate Thin Film of Metal-Oxide Nitride-Oxide Semiconductor Type Flash Memory by Using Scanning Nonlinear … Honda, Koichiro, Cho, Yasuo Materials Research Society
2 Conference Proceedings Scanning Electron-Beam Dielectric Microscopy for the Temperature Coefficient Distribution of Dielectric Materials Cho, Yasuo Materials Research Society	8 Conference Proceedings Nanometer Scale Domain Measurement of Ferroelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy Odagawa, Hiroyuki, Matsuura, Kaori, Cho, Yasuo Materials Research Society
3 Conference Proceedings Visualization of Polarization and Two Dimensional Electron Gas Distribution in AlGaN/GaN Heterostructure Using Scanning Nonlinear Dielectric Microscopy K. Hirose, N. Chinone, Y. Cho Trans Tech Publications	9 Conference Proceedings Basic Study on High-Density Ferroelectric Data Storage Using Scanning Nonlinear Dielectric Microscopy Hiranaga, Yoshiomi, Fujimoto, Kenjiro, Wagatsuma, Yasuo, Cho, Yasuo, Onoe, Atsushi, Terabe, Kazuya, Kitamura, Kenji Materials Research Society
4 Conference Proceedings Observation of Dopant Profile of Transistors Using Scanning Nonlinear Dielectric Microscopy Koichiro Honda, Yasuo Cho Materials Research Society	10 Conference Proceedings Universal Parameter Evaluating SiO₂/SiC Interface Quality Based on Scanning Nonlinear Dielectric Microscopy N. Chinone, A. Nayak, R. Kosugi, Y. Tanaka, S. Harada, Y. Kiuchi, H. Okumura, Y. Cho Trans Tech Publications
5 Conference Proceedings Polarization Reversal Anti-Parallel to the Applied Electric Field Observed Using a Scanning Nonlinear Dielectric Microscopy Morita, Takeshi, Cho, Yasuo Materials Research Society	11 Conference Proceedings Two-Dimensional Imaging of Trap Distribution in SiO₂/SiC Interface Using Local Deep Level Transient Spectroscopy Based on Super-Higher-Order Scanning … N. Chinone, R. Kosugi, Y. Tanaka, S. Harada, H. Okumura, Y. Cho Trans Tech Publications
6 Conference Proceedings Measurement of Three Dimensional Polarization Direction in Ferroelectric Thin Films Using Scanning Nonlinear Dielectric Microscopy With Rotating Electric Field Odagawa, Hiroyuki, Cho, Yasuo Materials Research Society	12 Conference Proceedings Nonlinear Dynamics and Control of the Scan Process in Atomic Force Microscopy S. Hornstein, O. Gottlieb American Society of Mechanical Engineers

1

2

3

4

5

6

7

8

9

10

11

12