Band Bending Near the Surface In GaN as Detected by a Charge Sensitive Probe
- Author(s):
- Publication title:
- GaN and related alloys - 2003 : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 798
- Pub. Year:
- 2004
- Page(from):
- 793
- Page(to):
- 798
- Pages:
- 6
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997363 [1558997369]
- Language:
- English
- Call no.:
- M23500/798
- Type:
- Conference Proceedings
Similar Items:
Materials Research Society |
7
Conference Proceedings
Surface Structure and Polarization Effects in GaN Thin Films as Studied by Electric Force Microscopy
Materials Research Society |
Materials Research Society |
Materials Research Society |
Materials Research Society |
9
Conference Proceedings
Investigation of The Surface Polarity, Defects, Electrical And Optical Properties of GaN Grown by MBE, MOCVD, And HVPE *
Electrochemical Society |
Materials Research Society |
10
Conference Proceedings
Effects of GaN Passivation With SiO2 and SiNx Studied by Photoluminescence and Surface Potential Electric Force Microscopy
Materials Research Society |
5
Conference Proceedings
Photoluminescence Of GaN Grown By Molecular Beam Epitaxy On Freestanding GaN Template
Materials Research Society |
11
Conference Proceedings
Microstructure and Optical Properties of GaN Films Grown on Porous SiC Substrate By MBE
Materials Research Society |
Materials Research Society |
Materials Research Society |