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Deep Defects in Fe-Doped GaN Layers Analysed by Electrical and Photoelectrical Spectroscopic Methods

Author(s):
Witte, H.
Fluegge, K.
Dadgar, A.
Krtschil, A.
Krost, A.
Christen, J
1 more
Publication title:
GaN and related alloys - 2003 : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
798
Pub. date:
2004
Page(from):
575
Page(to):
582
Pages:
8
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997363 [1558997369]
Language:
English
Call no.:
M23500/798
Type:
Conference Proceedings

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