'Recovery' Effect of Electron Induced Damage in 4H-SiC Schottky Diodes

'Recovery' Effect of Electron Induced Damage in 4H-SiC Schottky Diodes

Author(s):

Castaldini, A.

Publication title:

Radiation effects and ion-beam processing of materials : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

792

Pub. Year:

2004

Page(from):

611

Page(to):

616

Pages:

6

Pub. info.:

Warrendale, PA: Materials Research Society

ISSN:

02729172

ISBN:

9781558997301 [155899730X]

Language:

English

Call no.:

M23500/792

Type:

Conference Proceedings

Details

TDL ID:	ZA00014464
Series ID:	PA00000011
Conf. info. (Name):	Symposium on radiation effects and ion-beam processing of materials
Conf. info. (Number):	2003
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	2003.12.01-2003.12.05

Similar Items:

1 Conference Proceedings Electron-Induced Damage Effects in 4H-SiC Schottky Diodes Castaldini, A., Cavallini, A., Nava, F., Fuochi, P.G., Vanni, P. Trans Tech Publications	7 Conference Proceedings Deep Levels Induced by High Fluence Proton Irradiation in Undoped GaAs Diodes Castaldini, A., Cavallini, A., Polenta, L., Canali, C., Nava, F., Ferrini, R., Galli, M. MRS - Materials Research Society
2 Conference Proceedings Charged Particle Detection Properties of Epitaxial 4H-SiC Schottky Diodes Nava, F., Vanni, P., Verzellesi, G., Castaldini, A., Cavallini, A., Polenta, L., Nipoti, R., Donolato, C. Trans Tech Publications	8 Conference Proceedings Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers Le Donne, A., Binetti, S., Acciarri, M., Castaldini, A., Nava, F., Cavallini, A., Pizzini, S. Trans Tech Publications
3 Conference Proceedings Electronic Levels Induced by Irradiation in 4H-Silicon Carbide Castaldini, A., Cavallini, A., Rigutti, L., Nava, F. Trans Tech Publications	9 Conference Proceedings Silicon Carbide for Alpha, Beta, Ion and Soft X-Ray High Performance Detectors Bertuccio, G., Binetti, S., Caccia, S., Casiraghi, R., Castaldini, A., Cavallini, A., Lanzieri, C., Donne, A. Le, Nava, … Trans Tech Publications
4 Conference Proceedings Correlation between Defects and Electrical Properties of 4H-SiC Based Schottky Diodes Scaltrito, L., Porro, S., Giorgis, F., Mandracci, P., Cocuzza, M., Pirri, C.F., Ricciardi, C., Ferrero, S., Richieri, … Trans Tech Publications	10 Conference Proceedings SiC-Based Schottky Diode Gas Sensors Hunter,G.W., Neudeck,P.G., Chen,L.-Y., Knight,D., Li,C.C., Wu,Q.H. Trans Tech Publications
5 Conference Proceedings Defect Influence on the Electrical Properties of 4H-SiC Schottky Diodes Scaltrito, L., Celasco, E., Porro, S., Ferrero, S., Giorgis, F., Pirri, C.F., Perrone, D., Meotto, U., Mandracci, P., … Trans Tech Publications	11 Conference Proceedings Deep Levels in 4H Silicon Carbide Epilayers Induced by Neutron-Irradiation up to 10^16 n/cm2 Anna Cavallini, Antonio Castaldini, Filippo Nava, Paolo Errani, Vladimir Cindro Materials Research Society
6 Conference Proceedings DEFECTS INDUCED BY PROTONS AND ｦﾃ-RAYS IN SEMI-INSULATING GaAs DETECTORS Castaldini, A., Cavallini, A., Papa, C. del, Fuochi, G., Alietti, M., Canali, C., Nava, F., Paccagnella, A., Lanzieri, … MRS - Materials Research Society	12 Conference Proceedings Dislocation-Related Deep States Induced by Irradiation in HVPE n-GaN Castaldini, A., Cavallini, A., Polenta, L. Materials Research Society

1

2

3

4

5

6

7

8

9

10

11

12