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Mortality Dependence of Cu Dual Damascene Interconnects on Adjacent Segment

Author(s):
Chang, C.W.
Gan, C.L.
Thompson, C.V.
Pey, K.L.
Choi, W.K.
Hwang, N.
1 more
Publication title:
Materials, technology and reliability for advanced interconnects and low-k dielectrics - 2004 : symposium held April 13-15, 2004, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
812
Pub. Year:
2004
Page(from):
339
Page(to):
344
Pages:
6
Pub. info.:
Warrendale: Materials Research Society
ISSN:
02729172
ISBN:
9781558997622 [1558997628]
Language:
English
Call no.:
M23500/812
Type:
Conference Proceedings

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