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Electrical Modeling and Simulation of Nanoscale MOS Devices With a High-Permittivity Dielectric Gate Stack

Author(s):
Autran, J.L.
Munteanu, D.
Houssa, M.
Bescond, M.
Garros, X.
Leroux, C.
1 more
Publication title:
Integration of advanced micro- and nanoelectronic devices - critical issues and solutions : symposium held April 13-16, 2004, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
811
Pub. date:
2004
Page(from):
177
Page(to):
188
Pages:
12
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997615 [155899761X]
Language:
English
Call no.:
M23500/811
Type:
Conference Proceedings

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