The Development of Scanning Microwave Microscope for High-Throughput Characterization of Dielectric and Conducting Materials at Low Temperatures | 東京工業大学附属図書館文献データベース

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The Development of Scanning Microwave Microscope for High-Throughput Characterization of Dielectric and Conducting Materials at Low Temperatures

Author(s):

Okazaki, Noriaki

Sugaya, Hidetaka

Chikyow, Toyohiro

Fukumura, Tomoteru

Kawasaki, Masashi

Murakami, Makoto

Mastumoto, Yuji

Koinuma, Hideomi

Hasegawa, Tetsuya

Publication title:

Combinatorial and artificial intelligence methods in materials science II : symposium held December 1-4, Boston, Massachusetts, U.S.A

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

804

Pub. Year:

2004

Page(from):

249

Page(to):

254

Pages:

6

Pub. info.:

Warrendale, Pa.: Materials Research Society

ISSN:

02729172

ISBN:

9781558997424 [1558997423]

Language:

English

Call no.:

M23500/804

Type:

Conference Proceedings

Details

TDL ID:	ZA00014446
Series ID:	PA00000011
Conf. info. (Name):	MRS Fall Meeting : Symposium JJ ; Symposium on Combinatorial and Artificial Intelligence Methods in Materials Science
Conf. info. (Number):	2003 ; 2nd
Conf. info. (Venue):	Boston, Massachusetts, USA
Conf. info. (Date):	2003.12.01-2003.12.04

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