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Accelerated Reliability Test Inputs in Analyzing the Device Response of MgZnO Based UV Detector

Author(s):
Hullavarad, S. S.
Takeuchi, I.
Berger, J.
Dhar, S.
Chang, K. S.
Venkatesan, T.
Loughran, T. C.
Vispute, R. D.
Yedave, S. N.
4 more
Publication title:
Materials and devices for smart systems : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
785
Pub. Year:
2004
Page(from):
495
Page(to):
500
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997233 [1558997237]
Language:
English
Call no.:
M23500/785
Type:
Conference Proceedings

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