Experimental and Theoretical Joint Study on the Electronic and Structural Properties of Silicon Nanocrystals Embedded in SiO2: active Role of the Interface Region
- Author(s):
Daldosso, N. Luppi, M. Dalba, G. Pavesi, L. Rocca, F. Priolo, F. Franzo, G. Iacona, F. Degoli, E. Magri, R. Ossicini, S. - Publication title:
- Optoelectronics of group-IV-based materials : symposium held April 21-24, 2003, San Francisco, California, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 770
- Pub. Year:
- 2003
- Page(from):
- 87
- Page(to):
- 92
- Pages:
- 6
- Pub. info.:
- Warrendale, Pa.: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558997073 [1558997075]
- Language:
- English
- Call no.:
- M23500/770
- Type:
- Conference Proceedings
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