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Electrical and Structural Characterization of the Interface of Wafer Bonded InP/Si

Author(s):
Morral, A. Fontcuberta i
Zahler, J. M.
Atwater, Harry A.
Frank, M. M.
Chabal, Y. J.
Ahrenkiel, P.
Wanlass, M.
2 more
Publication title:
Intergration of heterogeneous thin-film materials and devices : symposium held April 23-24, 2003, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
768
Pub. Year:
2003
Page(from):
27
Page(to):
32
Pages:
6
Pub. info.:
Warrendale, PA: Materials Research Society
ISSN:
02729172
ISBN:
9781558997059 [1558997059]
Language:
English
Call no.:
M23500/768
Type:
Conference Proceedings

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