Blank Cover Image

Interfacial Relationships in Microelectronic Devices

Author(s):
Publication title:
Materials, Technology and Reliability for Advanced Interconnects and Low-k Dielectrics-2003 : symposium held April 21-25, 2003, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
766
Pub. Year:
2003
Page(from):
153
Page(to):
164
Pages:
12
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997035 [1558997032]
Language:
English
Call no.:
M23500/766
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings High Temperature Ceramic-tubed Reformer

Williams, Joseph J., Rosenberg, Robert A., McDonough, Lane J.

American Institute of Chemical Engineers
7 Conference Proceedings Design of Nanoporous Polyarylene Polymers for Use as Low-k Dielectrics in Microelectronic Devices

Silvis, H. Craig, Bouck, Kevin J., Godschalx, James P., Niu, Q. Jason, Radler, Michael J., Stokich, Ted M., Lyons, John …

American Chemical Society
2 Conference Proceedings AFM Studies of Deformation and Interfacial Sliding in Interconnect Structures in Microelectronic Devices

Park, C., Dutta, I., Peterson, K. A., Vella, J.

Materials Research Society
8 Conference Proceedings PACKAGING OF MICROELECTRONIC DEVICES

Manzione, L. T.

Society of Plastics Engineers, Inc. (SPE)
3 Conference Proceedings Interfacial Sliding In Back-End Interconnect Structures In Microelectronic Devices

Peterson, K.A., Park, C., Dutta, I.

Materials Research Society
9 Conference Proceedings HYDRIDE MOBILITY AND ITS RELATION TO STRUCTURE AND REACTIVITY IN POLYMETALLIC CLUSTERS

ROSENBERG E.

Kluwer Academic Publishers
4 Conference Proceedings HIGH PERFORMANCE METALLIZATION ISSUES FOR ULSI

Rosenberg, Robert

MRS - Materials Research Society
10 Conference Proceedings Growth via MOCVD and Characterization of GaN and AlxGa1-xN(0001) Alloys for Optoelectric and Microelectronic Device Applications

Davis, Robert F., Weeks, T. W., Jr., Bremser, M. D., Ailey, K. S., Perry, W. G.

MRS - Materials Research Society
5 Conference Proceedings Silicon Carbide: The Premier Paradigm for Structural and Microelectronic Device Applications in Severe Environments

Davis, Robert F.

MRS - Materials Research Society
11 Conference Proceedings 453b. The Removal of Ion-Implanted Photoresist from Microelectronic Devices Using Supercritical Carbon Dioxide

Pamela M. Visintin, Michael B. Korzenski, Thomas H. Baum, Koichiro Saga, Hitoshi Kuniyasu

American Institute of Chemical Engineers
6 Conference Proceedings CHARACTERIZATION OF THE EFFECT OF Au/Al BONDPAD CORROSION ON MICROELECTRONIC DEVICE RELIABILITY

Sorensen, N.R., Braithwaite, J.W., Peterson, D.W., Michael, J.R., Robinson, D.G., Strizich, M.P.

Electrochemical Society
12 Conference Proceedings Electro-Optical Properties and Interfacial Charges in Polymer-Dispersed Liquid Crystal Devices

Ramsey, Robert A., Sharma, Suresh C., Henry, Robert M., Atman, Jay B.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12