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Effects of Pre-Process Temperature Stressing on AlGaN/GaN HEMT Structures

Author(s):
Yannuzzi, Mark J.
Moser, Neil A.
Fitch, Robert C.
Jessen, Gregg H.
Gillespie, James K.
Via, Glen D.
Crespo, Antonio
Jenkins, Thomas J.
Look, David C.
Reynolds, Donald C.
5 more
Publication title:
New applications for wide-bandgap semiconductors : symposium held April 22-24, 2003, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
764
Pub. date:
2003
Page(from):
305
Page(to):
314
Pages:
10
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997011 [1558997016]
Language:
English
Call no.:
M23500/764
Type:
Conference Proceedings

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