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Statistical Analysis of Micropipe Defect Distributions in Silicon Carbide Crystals

Author(s):
Elkington, Troy
Emorhokpor, Ejiro
Kerr, Tom
Chen, John
Essary, Kevin
Golab, Mike
Hopkins, Richard H.
2 more
Publication title:
New applications for wide-bandgap semiconductors : symposium held April 22-24, 2003, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
764
Pub. date:
2003
Page(from):
177
Page(to):
182
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558997011 [1558997016]
Language:
English
Call no.:
M23500/764
Type:
Conference Proceedings

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