In Situ Electrical Characterization of Si During Nanoindentation
- Author(s):
- Publication title:
- Surface engineering 2002 - synthesis, characterization and applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.
- Title of ser.:
- Materials Research Society symposium proceedings
- Ser. no.:
- 750
- Pub. Year:
- 2003
- Page(from):
- 107
- Page(to):
- 112
- Pages:
- 6
- Pub. info.:
- Warrendale, Penn: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781558996878 [1558996877]
- Language:
- English
- Call no.:
- M23500/750
- Type:
- Conference Proceedings
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