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X-ray Characterization of Nanostructured Semiconductor Short-Period Superlattices

Author(s):
Li, Jianhua
Moss, S.C.
Holy, V.
Norman, A.G.
Mascarenhas, A.
Reno, J.L.
1 more
Publication title:
Morphological and compositional evolution of thin films : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
749
Pub. Year:
2003
Page(from):
389
Page(to):
394
Pages:
6
Pub. info.:
Warrendale, Pa.: Materials Research Society
ISSN:
02729172
ISBN:
9781558996861 [1558996869]
Language:
English
Call no.:
M23500/749
Type:
Conference Proceedings

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