MICROSCALE CONTACT CHARGING ON A SILICON OXIDE

MICROSCALE CONTACT CHARGING ON A SILICON OXIDE

Author(s):

Publication title:

Scanning probe microscopy : characterization, nanofabrication and device application of functional materials

Title of ser.:

NATO science series. Series 2, Mathematics, physics and chemistry

Ser. no.:

186

Pub. Year:

2005

Page(from):

289

Page(to):

308

Pages:

20

Pub. info.:

Dordrecht: Kluwer Academic Publishers

ISBN:

9781402030178 [1402030177]

Language:

English

Call no.:

N17050/186

Type:

Conference Proceedings

Details

TDL ID:	ZA00014360
Series ID:	PA00000025
Conf. info. (Name):	NATO Advanced Study Institute on Scanning Probe Microscopy
Conf. info. (Number):	2002
Conf. info. (Venue):	Algarve, Portugal
Conf. info. (Date):	2002.10.01-2002.10.13

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