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NANOSCALE ELECTRONIC MEASUREMENTS OF SEMICONDUCTORS USING KELVIN PROBE FORCE MICROSCOPY

Author(s):
Publication title:
Scanning probe microscopy : characterization, nanofabrication and device application of functional materials
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
186
Pub. date:
2005
Page(from):
119
Page(to):
152
Pages:
34
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISBN:
9781402030178 [1402030177]
Language:
English
Call no.:
N17050/186
Type:
Conference Proceedings

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