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Experimental Assessment of Quantum Effects in the Low-Frequency Noise and RTS of Deep Submicron MOSFETs

Author(s):
Publication title:
Advanced experimental methods for noise research in nanoscale electronic devices
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
151
Pub. Year:
2004
Page(from):
121
Page(to):
128
Pages:
8
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISBN:
9781402021688 [1402021682]
Language:
English
Call no.:
N17050/151
Type:
Conference Proceedings

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