Effect of Orientation Noise on the Determination of Percolation Thresholds from Electron Back-Scatter Pattern Data

Effect of Orientation Noise on the Determination of Percolation Thresholds from Electron Back-Scatter Pattern Data

Author(s):

Publication title:

Textures of materials : ICOTOM 14 : Proceedings of the 14th International Conference on Textures of Materials, held in Leuven, Belgium, July 11-15, 2005

Title of ser.:

Materials science forum

Ser. no.:

495-497(1)

Pub. Year:

2005

Page(from):

231

Page(to):

236

Pages:

6

Pub. info.:

Uetikon-Zuerich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878499755 [087849975X]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00014248
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Textures of Materials : ICOTOM
Conf. info. (Number):	14th
Conf. info. (Venue):	Leuven, Belgium
Conf. info. (Date):	2005.07.11-2005.07.15

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