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X-Ray Stress Measurement Using Whole Back Diffraction Ring

Author(s):
Publication title:
Residual stresses VII : ICRS 7 : proceedings of the 7th International Conference on Residual Stresses, ICRS-7 Xi'an, China, 14-17, June, 2004
Title of ser.:
Materials science forum
Ser. no.:
490-491
Pub. Year:
2005
Page(from):
137
Page(to):
142
Pages:
6
Pub. info.:
Uetikon-Zuerich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878499694 [0878499695]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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